내부 지터 발생기를 이용한 온칩의 지터 저항력 측정기Internal jitter tolerance tester with an internal jitter generator
- Assignee
- KAIST
- Country
- US (United States)
- Issue Date
- 2015-06-23
- Application Date
- 2013-11-01
- Application Number
- 14070249
- Registration Date
- 2015-06-23
- Registration Number
- 9065653
- Appears in Collection
- EE-Patent(특허)
- Files in This Item
- There are no files associated with this item.
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