Fabrication of a cylindrically textured YBCO film on a YSZ cylinder and its critical currents

Abstract

A cylindrically textured YBCO film was grown on a 60 degrees cylindrical sector of a YSZ single crystal whose [001] axis is parallel to the cylinder axis. The substrate surface was pretreated by oxygen ion milling followed by depositions of a 15 Angstrom thick CeO2 buffer layer and a 2000 Angstrom, thick YBCO layer. It was confirmed by XRD 2 theta and phi-scan that the c-axes were normal to the surfaces and the ah-axes were aligned in all regions. The critical current, J(c), for the axial direction at 76K was about 5x10(5) A/cm(2) and three times larger than that for the circumferential direction.