WEKO3
-
RootNode
アイテム
DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors
http://hdl.handle.net/10228/00007663
http://hdl.handle.net/10228/00007663d362f24f-8f7f-47c4-9727-bf84ea89c275
名前 / ファイル | ライセンス | アクション |
---|---|---|
![]() |
|
Item type | 学術雑誌論文 = Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2020-03-23 | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
タイトル | ||||||
タイトル | DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors | |||||
言語 | en | |||||
言語 | ||||||
言語 | eng | |||||
著者 |
Hasegawa, K
× Hasegawa, K× Tsuzakia, K× Nishizawa, S |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Attention has been paid to reliability-related issues for dc-link capacitors such as monitoring methods, powerloss estimation, and ageing tests. The degradation of the capacitors depends on their operating condition including temperature, ripple current, and dc-bias voltage, which has a strong influence on failures as well. In design stages of power converters, it is desirable to know the relation between the degradation and electrolytic parameters. This paper makes an intensive discussion on the voltage dependence of the degradation of a small aluminum electrolytic capacitor with an ageing test and a leakage-current measurement. The ageing test reveals that a higher dc-bias voltage brings a faster increase in ESR but results in a slower drop in capacitance in a range within the rated voltage. This result implies that either capacitance or ESR cannot be a unique indicator of the lifetime. Attention should be paid both to the ESR and to the capacitance when one monitors the capacitor condition. On the other hand, more than the rated voltage leads a rapid degradation of the capacitor, which can be confirmed by a leakage-current measurement instead of the ageing test. | |||||
言語 | en | |||||
書誌情報 |
en : Microelectronics Reliability 巻 83, p. 115-118, 発行日 2018-03-20 |
|||||
出版社 | ||||||
出版者 | Elsevier | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1016/j.microrel.2018.02.012 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0026-2714 | |||||
ISSN | ||||||
収録物識別子タイプ | EISSN | |||||
収録物識別子 | 1872-941X | |||||
著作権関連情報 | ||||||
権利情報 | Copyright (c) 2018 Elsevier Ltd. All rights reserved. | |||||
出版タイプ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
査読の有無 | ||||||
値 | yes | |||||
連携ID | ||||||
値 | 6789 |
Share
Cite as
Hasegawa, K, Tsuzakia, K, Nishizawa, S, 2018, DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors: Elsevier, 115–118 p.
Loading...