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Título: | Current-induced cleaning of graphene |
Autor: | Moser, Joel CSIC ORCID; Barreiro, Amelia CSIC; Bachtold, Adrian CSIC ORCID | Palabras clave: | Adsorption Carbon Quantum Hall effect Surface cleaning Surface contamination |
Fecha de publicación: | 19-oct-2007 | Editor: | American Institute of Physics | Citación: | Applied Physics Letters 91, 163513 (2007) | Resumen: | A simple yet highly reproducible method to suppress contamination of graphene at low temperature inside the cryostat is presented. The method consists of applying a current of several milliamperes through the graphene device, which is here typically a few microns wide. This ultrahigh current density is shown to remove contamination adsorbed on the surface. This method is well suited for quantum electron transport studies of undoped graphene devices, and its utility is demonstrated here by measuring the anomalous quantum Hall effect. | Descripción: | 3 pages, 4 figures.-- PACS nrs.: 81.05.Uw, 81.65.Cf, 68.35.Dv, 68.43.Mn, 73.43.Fj.-- ArXiv pre-print available at: http://arxiv.org/abs/0709.0607 | Versión del editor: | http://dx.doi.org/10.1063/1.2789673 | URI: | http://hdl.handle.net/10261/10475 | DOI: | 10.1063/1.2789673 | ISSN: | 0003-6951 |
Aparece en las colecciones: | (CIN2) Artículos (IMB-CNM) Artículos |
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APL-2007.pdf | 440,58 kB | Adobe PDF | Visualizar/Abrir |
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