Por favor, use este identificador para citar o enlazar a este item: http://hdl.handle.net/10261/136304
COMPARTIR / EXPORTAR:
logo share SHARE logo core CORE BASE
Visualizar otros formatos: MARC | Dublin Core | RDF | ORE | MODS | METS | DIDL | DATACITE

Invitar a revisión por pares abierta
Título

Atomic and electronic structure of bismuth-bilayer-terminated Bi2Se3(0001) prepared by atomic hydrogen etching

AutorShokri, Roozbeh; Meyerheim, Holger L.; Roy, Sumalay; Katayoon, Mohsemi; Ernst, Arthur; Otrokov, M. M. CSIC ORCID; Chulkov, Eugene V. CSIC ORCID; Kirschner, J.
Fecha de publicación2015
EditorAmerican Physical Society
CitaciónPhysical Review B 91(20): 205430 (2015)
ResumenA bilayer of bismuth is recognized as a prototype two-dimensional topological insulator. Here we present a simple and well reproducible top-down approach to prepare a flat and well ordered bismuth bilayer with a lateral size of several hundred nanometers on Bi2Se3(0001). Using scanning tunneling microscopy, surface x-ray diffraction, and Auger electron spectroscopy we show that exposure of Bi2Se3(0001) to atomic hydrogen completely removes selenium from the top quintuple layer. The band structure of the system, calculated from first principles for the experimentally derived atomic structure, is in excellent agreement with recent photoemission data. Our results open interesting perspectives for the study of topological insulators in general.
DescripciónUnder the terms of the Creative Commons Attribution License 3.0 (CC-BY).
Versión del editorhttp://dx.doi.org/10.1103/PhysRevB.91.205430
URIhttp://hdl.handle.net/10261/136304
DOI10.1103/PhysRevB.91.205430
Identificadoresdoi: 10.1103/PhysRevB.91.205430
issn: 2469-9950
e-issn: 2469-9969
Aparece en las colecciones: (CFM) Artículos




Ficheros en este ítem:
Fichero Descripción Tamaño Formato
atomic hydrogen etching.pdf1,81 MBAdobe PDFVista previa
Visualizar/Abrir
Mostrar el registro completo

CORE Recommender

SCOPUSTM   
Citations

25
checked on 06-abr-2024

WEB OF SCIENCETM
Citations

24
checked on 23-feb-2024

Page view(s)

287
checked on 22-abr-2024

Download(s)

420
checked on 22-abr-2024

Google ScholarTM

Check

Altmetric

Altmetric


Este item está licenciado bajo una Licencia Creative Commons Creative Commons