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| Título: | Evidence of a minority monoclinic LaNiO2.5 phase in lanthanum nickelate thin films |
Autor: | López-Conesa, L.; Rebled, José Manuel CSIC; Pesquera, David CSIC ORCID; Dix, Nico CSIC ORCID; Sánchez Barrera, Florencio CSIC ORCID; Herranz, Gervasi CSIC ORCID; Fontcuberta, Josep CSIC ORCID; Peiró, Francesca | Palabras clave: | Electron-diffraction Perovskites |
Fecha de publicación: | 7-abr-2017 | Editor: | Royal Society of Chemistry (UK) | Citación: | Physical Chemistry Chemical Physics 19(13): 9137-9142 (2017) | Resumen: | LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied by High Resolution Transmission Electron Microscopy (HRTEM) and (High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied by Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films. | Descripción: | López-Conesa, L. et al. | Versión del editor: | http://dx.doi.org/10.1039/C7CP00902J | URI: | http://hdl.handle.net/10261/151039 | DOI: | 10.1039/C7CP00902J | ISSN: | 1463-9076 |
| Aparece en las colecciones: | (ICMAB) Artículos |
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| Lopez_PCCP_2017_postprint.pdf | 1,59 MB | Adobe PDF |  Visualizar/Abrir |
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