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Título: | Phase contrast in tapping-mode scanning force microscopy |
Autor: | García García, Ricardo CSIC ORCID; Tamayo de Miguel, Francisco Javier CSIC ORCID; Calleja, Montserrat CSIC ORCID ; García-Pérez, Fernando CSIC | Palabras clave: | Tapping-mode operation Scanning force microscopy |
Fecha de publicación: | 1998 | Editor: | Springer Nature | Citación: | Applied Physics - Section A - Materials Science and Processing 66 Supplement 1: S309-S312 (1998) | Resumen: | The tapping-mode operation of a scanning force microscope represents an intermediate situation between contact and noncontact regimes. Its rapid development and expansion are due to lateral force minimization and its ability to give phase-contrast images of heterogeneous surfaces. Here, we calculate the phase shift between the cantilever excitation and its response as a function of the sample mechanical properties, tip–sample separation, and adhesion forces. We show that the phase shift that gives rise to phase-contrast images is associated with tip–sample interactions that involve energy dissipation such as adhesion energy hysteresis and viscoelasticity. Experimental phase-shift measurements performed on mica surfaces support the conclusions of the model. | Versión del editor: | http://dx.doi.org/10.1007/s003390051152 | URI: | http://hdl.handle.net/10261/35666 | DOI: | 10.1007/s003390051152 | ISSN: | 0947-8396 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
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