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Título: | Determination and simulation of nanoscale energy dissipation processes in amplitude modulation AFM |
Autor: | Gómez Castro, Carlos Javier CSIC; García García, Ricardo CSIC ORCID | Palabras clave: | Phase imaging AFM AmplitudemodulationAFM Energydissipation Force microscopy |
Fecha de publicación: | may-2010 | Editor: | Elsevier | Citación: | Ultramicroscopy 111(6): 626–633 (2010) | Resumen: | We develop a theoretical framework that explains the use of amplitudemodulationAFM to measure and identify energydissipationprocesses at the nanoscale. The variation of the dissipated energy on a surface by a vibrating tip as a function of its amplitude has a shape that singles out the dissipative process. The method is illustrated by calculating the dynamic-dissipation curves for surface adhesion energy hysteresis, long-range interfacial interactions and viscoelastic processes. We also show that by diving the dissipated energy by its maximum value, the dynamic-dissipation curves become independent of the experimental parameters. In particular, for long-range dissipative processes we have derived an analytical relationship that shows the independence of the normalized dynamic-dissipation curves with respect the free amplitude, cantilever constant or quality factor. | Descripción: | 11th International Scanning Probe Microscopy Conference | Versión del editor: | http://dx.doi.org/10.1016/j.ultramic.2010.02.023 | URI: | http://hdl.handle.net/10261/48272 | DOI: | 10.1016/j.ultramic.2010.02.023 | ISSN: | 0304-3991 |
Aparece en las colecciones: | (IMN-CNM) Artículos |
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