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Título: | A high-Q bandpass fully differential SC filter with enhanced testability |
Autor: | Vázquez, Diego CSIC ORCID; Rueda, Adoración CSIC ORCID; Huertas-Díaz, J. L. CSIC; Peralías, E. CSIC ORCID | Fecha de publicación: | 1998 | Editor: | Institute of Electrical and Electronics Engineers | Citación: | IEEE Journal of Solid-State Circuits 33(7): 976-986 (1998) | Resumen: | This paper presents a low-cost testing approach for switched-capacitor filters. A design for testability (DfT) methodology is discussed, and a system-level architecture is proposed providing capabilities for an off- and on-line test as well as a builtin self-test (BIST). To prove the feasibility of this approach, it has been applied to a sixth-order high-Q bandpass switched-capacitor (SC) filter. The benefit is a significant testability enhancement without degrading filter behavior. Experimental results from a silicon prototype are also presented. | URI: | http://hdl.handle.net/10261/84911 | DOI: | 10.1109/4.701236 | Identificadores: | doi: 10.1109/4.701236 issn: 0018-9200 |
Aparece en las colecciones: | (IMSE-CNM) Artículos |
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