Mirror enhanced STED super-resolution microscopy

Yang, X; Xie, H; Alonas, E; Liu, Y; Chen, X; Santangelo, PJ; Ren, Q; Xi, P; Jin, D

Mirror enhanced STED super-resolution microscopy

Yang, X Xie, H Alonas, E Liu, Y Chen, X Santangelo, PJ Ren, Q Xi, P Jin, D

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Publication Type:: Conference Proceeding
Citation:: 2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings, 2017, 2017-January pp. 1 - 2
Issue Date:: 2017-10-25

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Field	Value	Language
dc.contributor.author	Yang, X	en_US
dc.contributor.author	Xie, H	en_US
dc.contributor.author	Alonas, E	en_US
dc.contributor.author	Liu, Y	en_US
dc.contributor.author	Chen, X	en_US
dc.contributor.author	Santangelo, PJ	en_US
dc.contributor.author	Ren, Q	en_US
dc.contributor.author	Xi, P	en_US
dc.contributor.author	Jin, D https://orcid.org/0000-0003-1046-2666	en_US
dc.date.issued	2017-10-25	en_US
dc.identifier.citation	2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings, 2017, 2017-January pp. 1 - 2	en_US
dc.identifier.isbn	9781943580279	en_US
dc.identifier.uri	http://hdl.handle.net/10453/126710
dc.description.abstract	© 2017 IEEE. Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.	en_US
dc.relation.ispartof	2017 Conference on Lasers and Electro-Optics, CLEO 2017 - Proceedings	en_US
dc.relation.isbasedon	10.1364/CLEO_SI.2017.ATh1A.2	en_US
dc.title	Mirror enhanced STED super-resolution microscopy	en_US
dc.type	Conference Proceeding
utslib.citation.volume	2017-January	en_US
utslib.for	0205 Optical Physics	en_US
pubs.embargo.period	Not known	en_US
pubs.organisational-group	/University of Technology Sydney
pubs.organisational-group	/University of Technology Sydney/Faculty of Science
pubs.organisational-group	/University of Technology Sydney/Faculty of Science/School of Mathematical and Physical Sciences
pubs.organisational-group	/University of Technology Sydney/Strength - IBMD - Initiative for Biomedical Devices
utslib.copyright.status	closed_access
pubs.publication-status	Published	en_US
pubs.volume	2017-January	en_US

Abstract:

© 2017 IEEE. Through reflective interference, the axial thickness of confocal point spread function can be easily improved to 100 nm. Six-fold of axial resolution and two-fold of lateral resolution can be obtained for STED nanoscopy.

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http://hdl.handle.net/10453/126710