An In Situ Method For The Study Of Strain Broadening Using Synchrotron X-ray Diffraction

Publisher:
Blackwell Publishing
Publication Type:
Journal Article
Citation:
Journal Of Applied Crystallography, 2007, 40 (0), pp. 642 - 649
Issue Date:
2007-01
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A tensonometer for stretching metal foils has been constructed for the study of strain broadening in X-ray diffraction line profiles. This device, which is designed for use on powder diffractometers and was tested on Station 2.3 at Daresbury Laboratory,
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