Angle-resolved X-ray Photoelectron Spectroscopy (ARXPS) Study of Substitution Effects in Sb.sub.2./sub.Te.sub.3-x./sub.Se.sub.x./sub. Crystals and their Influence on Density of Antisite Defects

0180194 - UFCH-W 970053 RIV GB eng J - Článek v odborném periodiku
Bastl, Zdeněk - Spirovová, Ilona - Horák, Jaromír
Angle-resolved X-ray Photoelectron Spectroscopy (ARXPS) Study of Substitution Effects in Sb₂Te_3-xSe_x Crystals and their Influence on Density of Antisite Defects.
Solid State Ionics. Roč. 95, 3/4 (1997), s. 315-321. ISSN 0167-2738. E-ISSN 1872-7689
Grant CEP: GA ČR GA202/95/0042
Impakt faktor: 1.225, rok: 1997
Trvalý link: http://hdl.handle.net/11104/0001757