The use of an optically trapped microprobe for scanning details of surface

0205715 - UPT-D 20030098 RIV PL eng C - Konferenční příspěvek (zahraniční konf.)
Šerý, Mojmír - Jákl, Petr - Ježek, Jan - Jonáš, Alexandr - Zemánek, Pavel - Liška, M.
The use of an optically trapped microprobe for scanning details of surface.
Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259). Washington: SPIEThe International Society for Optical Engineering, 2003, s. 166 - 169.
[SPIE: Wave and Quantum Aspects of Contemporary Optics. Krzyzowa (PL), 09.09.2002-13.09.2002]
Grant CEP: GA ČR GA101/00/0974
Výzkumný záměr: CEZ:AV0Z2065902
Klíčová slova: optical tweezers * two-photon fluorescence * surface profiling
Kód oboru RIV: BH - Optika, masery a lasery

We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.
Trvalý link: http://hdl.handle.net/11104/0101328