Solid state field-assisted diffusion silver diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 glass

0387667 - ÚFE 2013 RIV RU eng J - Článek v odborném periodiku
Stepanov, B. - Wágner, T. - Lorinčík, Jan - Frumar, M. - Churbanov, M. - Chigirinsky, Y.
Solid state field-assisted diffusion silver diffusion in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 glass.
Inorganic Materials. Roč. 48, č. 6 (2012), s. 642-647. ISSN 0020-1685. E-ISSN 1608-3172
Institucionální podpora: RVO:67985882
Klíčová slova: Tellurite glass * Solid state diffusion * Secondary Ion Mass Spectrometry
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 0.376, rok: 2012

Silver_doped layers have been produced in (TeO2)0.6(WO3)0.25(La2O3)0.05(Na2O)0.1 (TWLN) glass by solid_state field_assisted diffusion. The silver concentration profile in the glass has been determined by secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS). The Matano–Boltzmann method applied to thermally activated diffusion indicates that the silver diffusion coefficient in the glass is a weak function of silver concentration. We carried out modeling of silver concentration profiles in the doped layer of the TWLN glass after solid_state field_assisted diffusion. Good agreement of the theoretical fit and experimental data suggests that the model chosen can be used to describe solid_state field_assisted diffusion of silver ions in TWLN glasses. Using RBS data, we have quantitatively estimated the surface density of silver atoms after field_assisted diffusion. Combining SIMS and RBS, we were able to assess the absolute silver concentration depth profile. Our results demonstrate that field_assisted diffusion, a simple and effective procedure for doping optical glasses, can be used to produce planar waveguide structures based on the tellurite glass studied here
Trvalý link: http://hdl.handle.net/11104/0220320