Annealing of PEEK, PET and PI implanted with Co ions at high fluencies

0395266 - ÚJF 2014 RIV NL eng J - Článek v odborném periodiku
Macková, Anna - Malinský, Petr - Mikšová, Romana - Pupíková, Hana - Khaibullin, R. I. - Valeev, V. F. - Švorčík, V. - Slepička, P.
Annealing of PEEK, PET and PI implanted with Co ions at high fluencies.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 307, č. 7 (2013), s. 598-602. ISSN 0168-583X. E-ISSN 1872-9584.
[18th International Conference on Ion Beam Modifications of Materials (IBMM). Qingdao, 02.09.2012-07.09.2012]
Grant CEP: GA ČR(CZ) GBP108/12/G108; GA MŠMT(XE) LM2011019
Institucionální podpora: RVO:61389005
Klíčová slova: Co-ions implantation * polymers * depth profiles * RBS * TEM * AFM
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 1.186, rok: 2013
http://www.sciencedirect.com/science/article/pii/S0168583X13000906

he properties of implanted polymers strongly depend on the implantation ion fluence and on the properties of the implanted atoms. The stability of synthesized nano-structures during further technological steps like annealing is of importance for their possible applications. Polyimide (PI), polyetheretherketone (PEEK), and polyethyleneterephtalate (PET) were implanted with 40 keV Co+ ions at room temperature at fluences ranging from 0.2 x 10(16) cm(-2) to 1.0 x 10(17) cm(-2) and annealed at a temperature of 200 degrees C. The implanted depth profiles of as-implanted and annealed samples, determined by the RBS method, were compared with the results of SRIM 2012 simulations. The structural and compositional changes of the implanted and subsequently annealed polymers were characterized by RBS and UV-vis spectroscopy. The surface morphology of as-implanted and annealed samples was examined by the AFM method and their electrical properties by sheet resistance measurement.
Trvalý link: http://hdl.handle.net/11104/0223343