Several examples of using contact profilometer for optical surface mapping

0399550 - FZÚ 2014 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Havelková, Martina - Hiklová, H.
Several examples of using contact profilometer for optical surface mapping.
Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics /18./. Bellingham: SPIE, 2012 - (Peřina jr., J.; Nožka, L.; Hrabovský, M.; Senderáková, D.; Urbańczyk, W.). Proceedings of SPIE, 8697. ISBN 978-0-8194-9481-8. ISSN 0277-786X.
[Czech-Polish-Slovak optical conference on wave and quantum aspects of contemporary optics /18./. Ostravice (CZ), 03.09.2012-07.09.2012]
Výzkumný záměr: CEZ:AV0Z10100522
Klíčová slova: contact sensing * contact profilometer * mapping of optical surfaces
Kód oboru RIV: BH - Optika, masery a lasery

The number of devices and methods for non-contact solid surface measurement and mapping is growing. Nevertheless contact devices still have value in measuring roughness, waviness and shape measurement. Modern contact devices measure without any negative influence to the surface and are even used for optical and other sensitive surfaces. Some examples are mentioned in the article below.
Trvalý link: http://hdl.handle.net/11104/0226837