Počet záznamů: 1
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films
- 1.0449326 - FZÚ 2016 RIV GB eng J - Článek v odborném periodiku
Šimek, Daniel - Kužel, R. - Rafaja, D.
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films.
Journal of Applied Crystallography. Roč. 39, č. 4 (2006), s. 487-501. ISSN 0021-8898. E-ISSN 1600-5767
Institucionální podpora: RVO:68378271
Klíčová slova: texture * stress * X-ray diffraction * reciprocal space mapping
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 2.495, rok: 2006
A method of reciprocal-space mapping followed by Rietveld-type refinement of the maps has been developed and tested for strongly textured thin films with fibre texture. The method is particularly useful for simultaneous analysis of stress and texture, expecially in non-cubic materials.
Trvalý link: http://hdl.handle.net/11104/0250882
Počet záznamů: 1