Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass

0458106 - FZÚ 2016 RIV CZ eng V - Výzkumná zpráva
Vaněček, Milan - Holovský, Jakub - Poruba, Aleš - Remeš, Zdeněk - Purkrt, Adam
Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass.
Praha: Tel Solar AG, Trübbach, Switzerland, 2015. 22 s.
Zdroj financování: N - neveřejné zdroje
Klíčová slova: optical properties * amorphous silicon * microcrystalline silicon * ZnO
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Optical and photoelectrical properties of materials from TEL Solar were characterized in the Institute of Physics, AS CR in a broad spectral region and a high dynamic range. Conclusions on material properties with respect to thin film silicon solar cells were drawn.
Trvalý link: http://hdl.handle.net/11104/0258426