DBR diode based laser source working at 633 nm for dimensional nanometrology

0467526 - ÚPT 2017 PL eng A - Abstrakt
Řeřucha, Šimon - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej - Yacoot, A.
DBR diode based laser source working at 633 nm for dimensional nanometrology.
NanoScale 2016. 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods. Wroclaw: Wroclaw University of Technology, 2016. s. 109-110.
[NanoScale 2016. Seminar on Quantitative Microscopy (QM) /11./ and Seminar on Nanoscale Calibration Standards and Methods /7./. 09.03.2016-11.03.2016, Wroclaw]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institucionální podpora: RVO:68081731
Klíčová slova: laser metrology * DBR laser diode * laser interferometry * displacement metrology * laser system
Kód oboru RIV: BH - Optika, masery a lasery

We have assembled an experimental iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength that is in a close proximity to the wavelength of a stabilized He-Ne lasers traditionally used for metrological applications.
Trvalý link: http://hdl.handle.net/11104/0265622