Počet záznamů: 1
Study of uncertainties of height measurements of monoatomic steps on Si 5 × 5 using DFT
- 1.0473812 - FZÚ 2018 RIV GB eng J - Článek v odborném periodiku
Campbell, A.C. - Jelínek, Pavel - Klapetek, P.
Study of uncertainties of height measurements of monoatomic steps on Si 5 × 5 using DFT.
Measurement Science and Technology. Roč. 28, č. 3 (2017), 1-6, č. článku 034005. ISSN 0957-0233. E-ISSN 1361-6501
Institucionální podpora: RVO:68378271
Klíčová slova: DFT * AFM
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 1.685, rok: 2017
In this contribution, sources of uncertainty for height measurements using atomic force microscopy (AFM) in contact mode are discussed. Results of density functional theory (DFT) modeling of AFM scans on a monoatomic step on silicon 5 times 5 are presented.
Trvalý link: http://hdl.handle.net/11104/0270946
Počet záznamů: 1