Electron band bending and surface sensitivity: X-ray photoelectron spectroscopy of polar GaN surfaces

0479214 - FZÚ 2018 RIV NL eng J - Článek v odborném periodiku
Bartoš, Igor - Romanyuk, Olexandr - Paskova, T. - Jiříček, Petr
Electron band bending and surface sensitivity: X-ray photoelectron spectroscopy of polar GaN surfaces.
Surface Science. Roč. 664, Oct (2017), s. 241-245. ISSN 0039-6028. E-ISSN 1879-2758
Grant CEP: GA ČR(CZ) GBP108/12/G108; GA MŠMT LM2015088
Institucionální podpora: RVO:68378271
Klíčová slova: GaN * XPS * band banding
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 1.997, rok: 2017

GaN polar surfaces were investigated by X-ray photoelectron spectroscopy (XPS). Variation of Ga 3d core level peak maxima with photoelectron emission angle was revealed and was assigned to the electron attenuation anisotropy in crystals. The effect is more pronounced on surfaces with large band bending. It is suggested, that the angle-resolved XPS investigations of crystalline surfaces should rather be performed along the low-symmetry azimuthal directions of crystals.
Trvalý link: http://hdl.handle.net/11104/0275287