X-ray analysis of fully depleted CCDs with small pixel size

0485070 - FZÚ 2018 RIV NL eng J - Článek v odborném periodiku
Kotov, I.V. - Haupt, J. - Kubánek, Petr - O'Connor, P. - Takacs, P.
X-ray analysis of fully depleted CCDs with small pixel size.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 787, Jul (2015), s. 12-19. ISSN 0168-9002. E-ISSN 1872-9576
Institucionální podpora: RVO:68378271
Klíčová slova: charge diffusion * Charge transfer efficiency * CTE * CCD
Obor OECD: Astronomy (including astrophysics,space science)
Impakt faktor: 1.200, rok: 2015

X-ray frames offer a lot of information about CCD. sources are traditionally being used for CCD gain and charge transfer efficiency (CTE) measurements. We demonstrate how spectral lines of 55Fe and 241Am rad. sources are used for system linearity measurements. The pixel size of modern scientific CCDs is getting smaller. The charge diffusion causes the charge spread among neighboring pixels especially in thick fully depleted sensors. This enables measurement of the charge diffusion using 55Fe X-rays. On the other hand, the usual CTE characterization method based on single pixel X-ray events becomes statistically deficient. A new way of measuring CTE using shape and amplitude analysis of X-ray clusters is presented and discussed. The lateral diffusion measured using e2v CCD250 is presented and implications for X-ray cluster size and expected cluster shape are discussed. The CTE analysis using total X-ray cluster amplitude is presented.

Trvalý link: http://hdl.handle.net/11104/0280173