Amorphous SiO.sub.x./sub.C.sub.y./sub.(:Er) films deposited by RF-magnetron sputtering on ZrB.sub.2./sub.-SiC ceramics: antioxidation and strengthening effects

0501814 - FZÚ 2019 RIV CH eng J - Článek v odborném periodiku
Vasin, A.V. - Neshpor, I. P. - Mosina, T. V. - Vedel, D. V. - Rusaysky, A. V. - Kopeček, Jaromír - Nazarov, A.N. - Grigoriev, O. N.
Amorphous SiO_xC_y(:Er) films deposited by RF-magnetron sputtering on ZrB₂-SiC ceramics: antioxidation and strengthening effects.
Surface and Coatings Technology. Roč. 343, June (2018), s. 11-16. ISSN 0257-8972
Institucionální podpora: RVO:68378271
Klíčová slova: zirconium diboride * oxidation behavior * composites * glasses * air
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 3.192, rok: 2018

The effect of amorphous a-SiOxCy(:Er) layers on the oxidation behavior of ZrB2-SiC composite ceramics has been studied. ZrB2–15%SiC composite samples were obtained by hot pressing of ZrB2 +15%SiC powder at 1850оС and 48 MPa. Amorphous a-SiOxCy:(Er) thin films (1 μm thick) were deposited on ZrB2-SiC specimens at a temperature of 200 °C by reactive RF-magnetron sputtering of SiC/Er target in argon/oxygen flow.

Trvalý link: http://hdl.handle.net/11104/0293798