Hard x-ray multi-projection imaging for single-shot approaches

0502119 - FZÚ 2019 RIV US eng J - Článek v odborném periodiku
Villanueva-Perez, P. - Pedrini, B. - Mokso, R. - Vagovič, P. - Guzenko, V. A. - Leake, S. J. - Willmott, P. R. - Oberta, Peter - David, C. - Chapman, H.N. - Stampanoni, M.
Hard x-ray multi-projection imaging for single-shot approaches.
Optica. Roč. 5, č. 12 (2018), s. 1521-1524. ISSN 2334-2536. E-ISSN 2334-2536
Institucionální podpora: RVO:68378271
Klíčová slova: science * x-ray * electron
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 9.263, rok: 2018

High-brilliance x-ray sources (x-ray free-electron lasers or diffraction-limited storage rings) allow the visualization of ultrafast processes in a 2D manner using single exposures. Current 3D approaches scan the sample using multiple exposures, and hence they are not compatible with single-shot acquisitions. Here we propose and verify experimentally an x-ray multi-projection imaging approach, which uses a crystal to simultaneously acquire nine angularly resolved projections with a single x-ray exposure. When implemented at high-brilliance sources, this approach can provide volumetric information of natural processes and non-reproducible samples in the micrometer to nanometer resolution range, and resolve timescales from microseconds down to femtoseconds.High-brilliance x-ray sources (x-ray free-electron lasers or diffraction-limited storage rings) allow the visualization of ultrafast processes in a 2D manner using single exposures. Current 3D approaches scan the sample using multiple exposures, and hence they are not compatible with single-shot acquisitions. Here we propose and verify experimentally an x-ray multi-projection imaging approach, which uses a crystal to simultaneously acquire nine angularly resolved projections with a single x-ray exposure. When implemented at high-brilliance sources, this approach can provide volumetric information of natural processes and non-reproducible samples in the micrometer to nanometer resolution range, and resolve timescales from microseconds down to femtoseconds.

Trvalý link: http://hdl.handle.net/11104/0294081