Electron vortex beams in the scanning electron microscope

0540306 - ÚPT 2021 CZ eng A - Abstrakt
Řiháček, Tomáš - Horák, M. - Schachinger, T. - Mika, Filip - Matějka, Milan - Fořt, Tomáš - Radlička, Tomáš - Novák, L. - Seďa, B. - McMorran, B.J. - Béché, A. - Verbeeck, J. - Müllerová, Ilona
Electron vortex beams in the scanning electron microscope.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 42.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: electron vortex beams * SEM
Obor OECD: Electrical and electronic engineering

Beam shaping in the (scanning) transmission electron microscope ((S)TEM) has been developingin the past decade as a tool for extending analytical abilities of conventional microscopes. A specific application of the beam sculpturing are electron vortex beams (EVBs). They were introduced in 2007 and experimentally realized in 2010. These beams, characterized by a well-defined orbital angular momentum in a direction of propagation, have been demonstrated as a tool for chiral energy-loss spectroscopy, probing surface plasmon properties or manipulating with nanoparticles. So far, all these experiments have been performed solely in the (S)TEM, where a detection of the probe current density distribution is quite straightforward. On the other hand, such a probecharacterization is rather challenging in the scanning electron microscope (SEM).
Trvalý link: http://hdl.handle.net/11104/0317957