The data collected by NA48/2 in 2003-2004 allowed several precise measurements in the charged kaon decay sector. In this paper we present the results obtained using a sample of 2.5×106 K± → π0μ±ν (Kμ3) and 4.0×106 K × → π0l ±ν (Ke3) events, collected in 2004 using a minimal trigger configuration. This unbiassed sample of kaon decays allows a high precision measurement of the semileptonic form factors.
High precision measurement of the form factors of the semileptonic decays K± → π0l±ν (Kl3) in NA48/2
BALDINI, Wander;COTTA RAMUSINO, Angelo;DALPIAZ, Pietro;FIORINI, Massimiliano;GIANOLI, Alberto;PETRUCCI, Ferruccio Carlo;SAVRIE', Mauro;
2012
Abstract
The data collected by NA48/2 in 2003-2004 allowed several precise measurements in the charged kaon decay sector. In this paper we present the results obtained using a sample of 2.5×106 K± → π0μ±ν (Kμ3) and 4.0×106 K × → π0l ±ν (Ke3) events, collected in 2004 using a minimal trigger configuration. This unbiassed sample of kaon decays allows a high precision measurement of the semileptonic form factors.File in questo prodotto:
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