The aim of this study is to assess angle-dependent systematic errors and measurement uncertainties for a conoscopic holography laser sensor mounted on a Coordinate Measuring Machine (CMM). The main contribution of our work is the definition of a methodology for the derivation of point-sensitive systematic and random errors, which must be determined in order to evaluate the accuracy of the measuring system. An ad hoc three dimensional artefact has been built for the task. The experimental test has been designed so as to isolate the effects of angular variations from those of other influence quantities that might affect the measurement result. We have found the best measurand to assess angle-dependent errors, and found some preliminary results on the expression of the systematic error and measurement uncertainty as a function of the zenith angle for the chosen measurement system and sample material.

Estimating angle-dependent systematic error and measurement uncertainty for a conoscopic holography measurement system

PAVIOTTI, ANNA;CARMIGNATO, SIMONE;VOLTAN, ALESSANDRO;LAURENTI, NICOLA;CORTELAZZO, GUIDO MARIA
2009

Abstract

The aim of this study is to assess angle-dependent systematic errors and measurement uncertainties for a conoscopic holography laser sensor mounted on a Coordinate Measuring Machine (CMM). The main contribution of our work is the definition of a methodology for the derivation of point-sensitive systematic and random errors, which must be determined in order to evaluate the accuracy of the measuring system. An ad hoc three dimensional artefact has been built for the task. The experimental test has been designed so as to isolate the effects of angular variations from those of other influence quantities that might affect the measurement result. We have found the best measurand to assess angle-dependent errors, and found some preliminary results on the expression of the systematic error and measurement uncertainty as a function of the zenith angle for the chosen measurement system and sample material.
2009
Proceedings of SPIE, vol. 7239 Three-Dimensional Imaging Metrology.
9780819474896
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11577/2437846
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 6
  • ???jsp.display-item.citation.isi??? ND
social impact