In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of Si-28 {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value d(220) = 192 014 711.98(34) am having a reduced uncertainty. (C) 2015 AIP Publishing LLC.
A More Accurate Measurement of the Si-28 Lattice Parameter / Massa, Enrico; Sasso, CARLO PAOLO; Mana, Giovanni; Palmisano, C.. - In: JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. - ISSN 0047-2689. - 44:3(2015), p. 031208. [10.1063/1.4917488]
A More Accurate Measurement of the Si-28 Lattice Parameter
MASSA, ENRICO
;SASSO, CARLO PAOLO;MANA, GIOVANNI;
2015
Abstract
In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of Si-28 {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value d(220) = 192 014 711.98(34) am having a reduced uncertainty. (C) 2015 AIP Publishing LLC.| File | Dimensione | Formato | |
|---|---|---|---|
|
2015_d220_AIP.pdf
accesso aperto
Descrizione: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article may be found at DOI indicated above.
Tipologia:
Versione editoriale
Licenza:
Pubblico - Tutti i diritti riservati
Dimensione
1.14 MB
Formato
Adobe PDF
|
1.14 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
