Hofmann, S. Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Prieto, P., Hofmann, S., Elizalde, E., & Sanz, J. M. (2004). Variation of the electron inelastic mean free path during depth profiling of the Fe/Si interface as determined by quantitative REELS. Surface and Interface Analysis, 36(10), 1392-1401.