Su, Dang Sheng Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;
ApplSurfSci254.pdf (beliebiger Volltext), 891KB
Gajović, A., Gracin, D., Djerdj, I., Tomašić, N., Juraić, K., & Su, D. S. (2008). Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties. Applied Surface Science, 254(9), 2748-2754. doi:10.1016/j.apsusc.2007.10.014.