Scanning probe microscopy: Close-up on spin coherence

Loth, S.; Burgess, J.A.J; Yan, S.

doi:10.1038/nnano.2014.164

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Scanning probe microscopy: Close-up on spin coherence

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Loth, S.
Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Max Planck Institute for Solid State Research;

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Burgess, J.A.J
Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Max Planck Institute for Solid State Research;

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Yan, S.
Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Max Planck Institute for Solid State Research;

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http://dx.doi.org/10.1038/nnano.2014.164
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Loth, S., Burgess, J., & Yan, S. (2014). Scanning probe microscopy: Close-up on spin coherence. Nature Nanotechnology, (9), 574-575. doi:10.1038/nnano.2014.164.

Cite as: https://hdl.handle.net/11858/00-001M-0000-001A-32D8-8

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