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Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2013). Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples. Talk presented at GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013. Paris, France. 2013-11-26.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-415B-7
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