A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an 
energy-dispersive pn-junction charge-coupled device

Abboud, Ali; Kirchlechner, Christoph; Send, Sebastian; Micha, Jean-Sebastien; Ulrich, Oliver; Pashniak, N.; Strüder, Lothar W.; Kečkéš, Jozef; Pietsch, Ullrich

doi:10.1063/1.4900482

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A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device

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Kirchlechner, Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials Physics, Montanuniversität Leoben, Austria;

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Abboud, A., Kirchlechner, C., Send, S., Micha, J.-S., Ulrich, O., Pashniak, N., et al. (2014). A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device. Review of Scientific Instruments, 85(11): 113901. doi:10.1063/1.4900482.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-6B73-C

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