Nanoelectronic COupled Problems Solutions - nanoCOPS: Modelling, Multirate, 
Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation

ter Maten, E. Jan W.; Putek, Piotr; Günther, Michael; Pulch, Roland; Tischendorf, Caren; Strohm, Christian; Schoenmaker, Wim; Meuris, Peter; de Smedt, Bart; Benner, Peter; Feng, Lihong; Banagaaya, Nicodemus; Yue, Yao; Janssen, Rick; Dohmen, Jos J.; Tasić, Bratislav; Deleu, Frederik; Gillon, Renaud; Wieers, Aarnout; Brachtendorf, Hans-Georg; Bittner, Kai; Kratochvíl, Tomáš; Petřzela, Jiří; Sotner, Roman; Göthans, Tomáš; Dřínovský, Jiří; Schöps, Sebastian; Duque Guerra, David J.; Casper, Thorben; De Gersem, Herbert; Römer, Ulrich; Reynier, Pascal; Barroul, Patrice; Masliah, Denis; Rousseau, Benoît

doi:10.1186/s13362-016-0025-5

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Nanoelectronic COupled Problems Solutions - nanoCOPS: Modelling, Multirate, Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation

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Benner, Peter
Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Feng, Lihong
Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Banagaaya, Nicodemus
Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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Yue, Yao
Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society;

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ter Maten, E. J. W., Putek, P., Günther, M., Pulch, R., Tischendorf, C., Strohm, C., et al. (2016). Nanoelectronic COupled Problems Solutions - nanoCOPS: Modelling, Multirate, Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation. Journal of Mathematics in Industry, 7(1): 2, 19 pages. doi:10.1186/s13362-016-0025-5.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002B-2EF8-1

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