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News Press Releases (NTID)
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Perseverance is key, NTID's Hurwitz tells deaf grads
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NTIDArticle06-18-2004.pdf (12.33Kb)
Date
2004-06-18
Author
NTID
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Abstract
Dr. T. Alan Hurwitz, vice president for Rochester Institute of Technology and dean of the National Technical Institute for the Deaf, told deaf high school graduates that higher education and perseverance are critical to success.
URI
http://hdl.handle.net/1850/10374
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News Press Releases (NTID)
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