A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers
- Author
- W De Bosscher, Roland Vanmeirhaeghe (UGent) , A De Laere, Willy Laflere and Felix Cardon
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Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-2085699
- MLA
- De Bosscher, W., et al. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS, vol. 31, no. 5, 1988, pp. 945–51, doi:10.1016/0038-1101(88)90049-4.
- APA
- De Bosscher, W., Vanmeirhaeghe, R., De Laere, A., Laflere, W., & Cardon, F. (1988). A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS, 31(5), 945–951. https://doi.org/10.1016/0038-1101(88)90049-4
- Chicago author-date
- De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, Willy Laflere, and Felix Cardon. 1988. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS 31 (5): 945–51. https://doi.org/10.1016/0038-1101(88)90049-4.
- Chicago author-date (all authors)
- De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, Willy Laflere, and Felix Cardon. 1988. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS 31 (5): 945–951. doi:10.1016/0038-1101(88)90049-4.
- Vancouver
- 1.De Bosscher W, Vanmeirhaeghe R, De Laere A, Laflere W, Cardon F. A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS. 1988;31(5):945–51.
- IEEE
- [1]W. De Bosscher, R. Vanmeirhaeghe, A. De Laere, W. Laflere, and F. Cardon, “A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers,” SOLID-STATE ELECTRONICS, vol. 31, no. 5, pp. 945–951, 1988.
@article{2085699, author = {{De Bosscher, W and Vanmeirhaeghe, Roland and De Laere, A and Laflere, Willy and Cardon, Felix}}, issn = {{0038-1101}}, journal = {{SOLID-STATE ELECTRONICS}}, language = {{eng}}, number = {{5}}, pages = {{945--951}}, title = {{A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers}}, url = {{http://doi.org/10.1016/0038-1101(88)90049-4}}, volume = {{31}}, year = {{1988}}, }
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