Academic Bibliography

 Search 200 years of publications by Ghent University researchers.
Advanced search
1 file | 636.14 KB
Add to list
  1. Search results
  2. A study of the electrical and interfa...

A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers

W De Bosscher, Roland Vanmeirhaeghe (UGent) , A De Laere, Willy Laflere and Felix Cardon
(1988) SOLID-STATE ELECTRONICS. 31(5). p.945-951
Author
Organization

Downloads

  • Download
    (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 636.14 KB

Citation

Please use this url to cite or link to this publication:

MLA
De Bosscher, W., et al. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS, vol. 31, no. 5, 1988, pp. 945–51, doi:10.1016/0038-1101(88)90049-4.
APA
De Bosscher, W., Vanmeirhaeghe, R., De Laere, A., Laflere, W., & Cardon, F. (1988). A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS, 31(5), 945–951. https://doi.org/10.1016/0038-1101(88)90049-4
Chicago author-date
De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, Willy Laflere, and Felix Cardon. 1988. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS 31 (5): 945–51. https://doi.org/10.1016/0038-1101(88)90049-4.
Chicago author-date (all authors)
De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, Willy Laflere, and Felix Cardon. 1988. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS 31 (5): 945–951. doi:10.1016/0038-1101(88)90049-4.
Vancouver
1.
De Bosscher W, Vanmeirhaeghe R, De Laere A, Laflere W, Cardon F. A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS. 1988;31(5):945–51.
IEEE
[1]
W. De Bosscher, R. Vanmeirhaeghe, A. De Laere, W. Laflere, and F. Cardon, “A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers,” SOLID-STATE ELECTRONICS, vol. 31, no. 5, pp. 945–951, 1988.
@article{2085699,
  author       = {{De Bosscher, W and Vanmeirhaeghe, Roland and De Laere, A and Laflere, Willy and Cardon, Felix}},
  issn         = {{0038-1101}},
  journal      = {{SOLID-STATE ELECTRONICS}},
  language     = {{eng}},
  number       = {{5}},
  pages        = {{945--951}},
  title        = {{A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers}},
  url          = {{http://doi.org/10.1016/0038-1101(88)90049-4}},
  volume       = {{31}},
  year         = {{1988}},
}
Altmetric
View in Altmetric
Web of Science
Times cited: