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Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT

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MLA
Putek, Piotr, et al. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, vol. 60, no. 4, 2011, pp. 497–518, doi:10.2478/v10171-011-0041-4.
APA
Putek, P., Crevecoeur, G., Slodicka, M., Gawrylczyk, K., Van Keer, R., & Dupré, L. (2011). Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT. ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, 60(4), 497–518. https://doi.org/10.2478/v10171-011-0041-4
Chicago author-date
Putek, Piotr, Guillaume Crevecoeur, Marian Slodicka, Kostanty Gawrylczyk, Roger Van Keer, and Luc Dupré. 2011. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING 60 (4): 497–518. https://doi.org/10.2478/v10171-011-0041-4.
Chicago author-date (all authors)
Putek, Piotr, Guillaume Crevecoeur, Marian Slodicka, Kostanty Gawrylczyk, Roger Van Keer, and Luc Dupré. 2011. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING 60 (4): 497–518. doi:10.2478/v10171-011-0041-4.
Vancouver
1.
Putek P, Crevecoeur G, Slodicka M, Gawrylczyk K, Van Keer R, Dupré L. Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT. ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING. 2011;60(4):497–518.
IEEE
[1]
P. Putek, G. Crevecoeur, M. Slodicka, K. Gawrylczyk, R. Van Keer, and L. Dupré, “Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT,” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, vol. 60, no. 4, pp. 497–518, 2011.
@article{2136707,
  author       = {{Putek, Piotr and Crevecoeur, Guillaume and Slodicka, Marian and Gawrylczyk, Kostanty and Van Keer, Roger and Dupré, Luc}},
  issn         = {{0004-0746}},
  journal      = {{ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING}},
  language     = {{eng}},
  number       = {{4}},
  pages        = {{497--518}},
  title        = {{Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT}},
  url          = {{http://doi.org/10.2478/v10171-011-0041-4}},
  volume       = {{60}},
  year         = {{2011}},
}

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