Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT
- Author
- Piotr Putek (UGent) , Guillaume Crevecoeur (UGent) , Marian Slodicka (UGent) , Kostanty Gawrylczyk, Roger Van Keer (UGent) and Luc Dupré (UGent)
- Organization
Downloads
-
(...).pdf
- full text
- |
- UGent only
- |
- |
- 2.59 MB
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-2136707
- MLA
- Putek, Piotr, et al. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, vol. 60, no. 4, 2011, pp. 497–518, doi:10.2478/v10171-011-0041-4.
- APA
- Putek, P., Crevecoeur, G., Slodicka, M., Gawrylczyk, K., Van Keer, R., & Dupré, L. (2011). Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT. ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, 60(4), 497–518. https://doi.org/10.2478/v10171-011-0041-4
- Chicago author-date
- Putek, Piotr, Guillaume Crevecoeur, Marian Slodicka, Kostanty Gawrylczyk, Roger Van Keer, and Luc Dupré. 2011. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING 60 (4): 497–518. https://doi.org/10.2478/v10171-011-0041-4.
- Chicago author-date (all authors)
- Putek, Piotr, Guillaume Crevecoeur, Marian Slodicka, Kostanty Gawrylczyk, Roger Van Keer, and Luc Dupré. 2011. “Two-Level Approach for Solving the Inverse Problem of Defects Identification in Eddy Current Testing: Type NDT.” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING 60 (4): 497–518. doi:10.2478/v10171-011-0041-4.
- Vancouver
- 1.Putek P, Crevecoeur G, Slodicka M, Gawrylczyk K, Van Keer R, Dupré L. Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT. ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING. 2011;60(4):497–518.
- IEEE
- [1]P. Putek, G. Crevecoeur, M. Slodicka, K. Gawrylczyk, R. Van Keer, and L. Dupré, “Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT,” ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING, vol. 60, no. 4, pp. 497–518, 2011.
@article{2136707, author = {{Putek, Piotr and Crevecoeur, Guillaume and Slodicka, Marian and Gawrylczyk, Kostanty and Van Keer, Roger and Dupré, Luc}}, issn = {{0004-0746}}, journal = {{ARCHIWUM ELEKTROTECHNIKI = ARCHIVES OF ELECTRICAL ENGINEERING}}, language = {{eng}}, number = {{4}}, pages = {{497--518}}, title = {{Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing: type NDT}}, url = {{http://doi.org/10.2478/v10171-011-0041-4}}, volume = {{60}}, year = {{2011}}, }
- Altmetric
- View in Altmetric