The ability to predict sample deformation and the resultant interaction forces is a vital component to preventing sample damage and acquiring accurate height traces in atomic force microscopy (AFM). By using the recently developed frequency and force modulation (FFM) control scheme, a prediction method is developed by coupling previously developed analytical work with numerical integration of the equation of motion for the AFM tip. By selecting a zero resonance frequency shift, the sample deformation is found to depend only on those parameters defining the tip-sample interaction forces. The results are represented graphically and through a multiple regression model so that the user can predict the tip penetration and maximum repulsive force with knowledge of the maximum attractive force and steepness of the repulsive regime in the tip-sample interaction force curve. The prediction model is shown to be accurate for a wide range of imaging conditions.