Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation
Publication status
publishedExternal links
Journal / series
Acta MaterialiaVolume
Pages / Article No.
Publisher
ElsevierSubject
Thin films; Plastic deformation; Tension test; X-ray diffraction (XRD); Synchrotron radiationOrganisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 24 August 2007. revised 19 December 2007. accepted 15 January 2008. available online 7 March 2008.More
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