Please use this identifier to cite or link to this item:
http://hdl.handle.net/20.500.12386/2119
Title: | Reflectivity and stress characterization of W/Si and Pt/C multilayer samples for the New Hard X-ray Mission phase B development | Authors: | SPIGA, Daniele Raimondi, L. SALMASO, Bianca Negri, R. |
Issue Date: | 2010 | Series: | OAB Technical Reports | Number: | 03/2010 | URI: | http://hdl.handle.net/20.500.12386/2119 | Fulltext: | none |
Appears in Collections: | 4.02 Rapporti tecnici pregressi |
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