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Electromagnetic radiation screening of semiconductor devices for long life applicationsA review is presented of the mechanism of interaction of electromagnetic radiation in various spectral ranges, with various semiconductor device defects. Previous work conducted in this area was analyzed as to its pertinence to the current problem. The task was studied of implementing electromagnetic screening methods in the wavelength region determined to be most effective. Both scanning and flooding type stimulation techniques are discussed. While the scanning technique offers a considerably higher yield of useful information, a preliminary investigation utilizing the flooding approach is first recommended because of the ease of implementation, lower cost and ability to provide go-no-go information in semiconductor screening.
Document ID
19730010030
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Hall, T. C. (Hughes Aircraft Co. Culver City, CA, United States)
Brammer, W. G. (Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 2, 2013
Publication Date
December 1, 1972
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-124119
Accession Number
73N18757
Funding Number(s)
CONTRACT_GRANT: NAS8-28937
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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