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Development study of the X-ray scattering properties of a group of optically polished flat samplesFour optically polished flat samples were tested at wavelengths of 8.34 A, 13.3 A, and 44 A and 0.5 deg, 0.92 deg, 1.5 deg, 2.0 deg and 4.0 deg angle of incidence. The four samples were also tested at 8.34 A and 0.92 deg angle of incidence for three additional angular orientations about an axis normal to the sample surface: 45 deg, 90 deg and 180 deg from the 0 deg position. The tests indicate that the scattering was greater at 44 A than at 13.3 A and 8.34 A. The orientation tests indicated that no great irregularities were present.
Document ID
19740012202
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Froechtenigt, J. F. (Martin Marietta Aerospace Denver, CO, United States)
Date Acquired
September 3, 2013
Publication Date
February 1, 1974
Subject Category
Physics, General
Report/Patent Number
MCR-73-333
NASA-CR-132939
Accession Number
74N20315
Funding Number(s)
CONTRACT_GRANT: NAS5-23198
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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