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Reliability and structural integrityAn analytic model is developed to calculate the reliability of a structure after it is inspected for cracks. The model accounts for the growth of undiscovered cracks between inspections and their effect upon the reliability after subsequent inspections. The model is based upon a differential form of Bayes' Theorem for reliability, and upon fracture mechanics for crack growth.
Document ID
19740012456
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Davidson, J. R. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1973
Subject Category
Structural Mechanics
Report/Patent Number
NASA-TM-X-71934
Meeting Information
Meeting: Anniv. Meeting of the Soc. of Eng. Sci.
Location: Raleigh, NC
Country: United States
Start Date: November 5, 1973
End Date: November 7, 1973
Accession Number
74N20569
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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