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The effects of the geosynchronous energetic particle radiation environment on spacecraft charging phenomenaThe energetic electron environment at the geosynchronous orbit is responsible for a variety of adverse charging effects on spacecraft components. The most serious of these is the degradation and failure of a complementary-metal-oxide-semiconductor (CMOS) electronic components as a result of internal charge-buildup induced by the energetic electrons. Efforts to accurately determine the expected lifetime of these components in this orbit are hampered by the lack of detailed knowledge of the electron spectrum and intensity, particularly of the more penetrating energies greater than 1.5 MeV. This problem is illustrated through the calculation of the dose received by a CMOS device from the energetic electrons and associated bremsstrahlung as a function of aluminum shielding thickness using the NASA AE-6 and the Aerospace measured electron environments. Two computational codes which were found to be in good agreement were used to perform the calculations. For a given shielding thickness the dose received with the two radiation environments differ by as much as a factor of seven with a corresponding variation in lifetime of the CMOS.
Document ID
19780002227
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Reagan, J. B. (Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Imhof, W. L. (Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Gaines, E. E. (Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Date Acquired
August 9, 2013
Publication Date
February 24, 1977
Publication Information
Publication: NASA. Lewis Res. Center Proc. of the Spacecraft Charging Technol. Conf.
Subject Category
Geophysics
Accession Number
78N10170
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19780002186Collected WorksProceedings of the Spacecraft Charging Technology Conference
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