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Moessbauer study in thin films of FeSi2 and FeSe systemsThin films of FeSi2 and FeSe were studied using Moessbauer spectroscopy information regarding dangling bond configuration and nature of crystal structure in thin films was derived. A significant influence of crystalline aluminum substrate on film structure was observed.
Document ID
19790002748
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Escue, W. J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Aggarwal, K.
(Indian Inst. of Technology)
Mendiratta, R. G.
(Indian Inst. of Technology)
Date Acquired
September 3, 2013
Publication Date
September 1, 1978
Subject Category
Solid-State Physics
Report/Patent Number
NASA-TM-78205
Accession Number
79N10919
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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