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System for the measurement of ultra-low stray light levelsAn apparatus is described for measuring the effectiveness of stray light suppression light shields and baffle arrangements used in optical space experiments and large space telescopes. The light shield and baffle arrangement and a telescope model are contained in a vacuum chamber. A source of short, high-powered light energy illuminates portions of the light shield and baffle arrangement and reflects a portion of same to a photomultiplier tube by virtue of multipath scattering. The resulting signal is transferred to time-channel electronics timed by the firing of the high energy light source allowing time discrimination of the signal thereby enabling the light scattered and suppressed by the model to be distinguished from the walls and holders around the apparatus.
Document ID
19790003694
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Wyman, C. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Griner, D. B. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Hurd, W. A. (Sperry Rand Corp. Huntsville, Ala., United States)
Shelton, G. B. (Sperry Rand Corp. Huntsville, Ala., United States)
Hunt, G. H. (Sperry Rand Corp. Huntsville, Ala., United States)
Fannin, B. B. (Ariz. Univ. Tucson, United States)
Brealt, R. P. (Ariz. Univ. Tucson, United States)
Hawkins, C. A. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 3, 2013
Publication Date
July 25, 1978
Subject Category
Optics
Accession Number
79N11865
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,102,580|NASA-CASE-MFS-23513-1
Patent Application
US-PATENT-APPL-SN-755323

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