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Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 4, Appendix CThe electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. Statistical analysis data is supplied along with write pulse width, read cycle time, write cycle time, and chip enable time data.
Document ID
19790023786
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Klute, A. (Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 3, 2013
Publication Date
June 1, 1979
Subject Category
Computer Operations And Hardware
Report/Patent Number
FR-79-76-915-VOL-4
NASA-CR-162264
HAC-REF-E0752-VOL-4
Accession Number
79N31957
Funding Number(s)
CONTRACT_GRANT: JPL-954789
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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