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A low energy electron magnetometerThe concept of a highly sensitive magnetometer based on the deflection of low energy electron beams in magnetic fields is analyzed. Because of its extremely low mass and consequently high e/m ratio, a low energy electron is easily deflected in a magnetic field, thus providing a basis for very low field measurement. Calculations for a specific instrument design indicate that a low energy electron magnetometer (LEEM) can measure magnetic fields as low as 1000 nT. The anticipated performance of LEEM is compared with that of the existing high resolution magnetometers in selected applications. The fast response time of LEEM makes it especially attractive as a potential instrument for magnetic signature analysis in large engineering systems.
Document ID
19800005174
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Singh, J. J. (NASA Langley Research Center Hampton, VA, United States)
Wood, G. M., Jr. (NASA Langley Research Center Hampton, VA, United States)
Rayborn, G. H. (Univ. of Southern Missippi Hattiesburg, United States)
White, F. A. (Rensselaer Polytechnic Inst. Troy, N. Y., United States)
Date Acquired
September 4, 2013
Publication Date
December 1, 1979
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-80172
L-13329
Accession Number
80N13429
Funding Number(s)
PROJECT: RTOP 505-33-43-02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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