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Characterization of boron carbide with an electron microprobeWithin the framework of a study of heterogeneous materials (Matteudi et al., 1971: Matteudi and Verchery, 1972) thin deposits of boron carbide were characterized. Experiments using an electronic probe microanalyzer to analyze solid boron carbide or boron carbide in the form of thick deposits are described. Quantitative results on boron and carbon are very close to those obtained when applying the Monte Carlo-type correction calculations.
Document ID
19830012769
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Matteudi, G. (NASA Headquarters Washington, DC United States)
Ruste, J. (NASA Headquarters Washington, DC United States)
Date Acquired
September 4, 2013
Publication Date
February 1, 1983
Subject Category
Composite Materials
Report/Patent Number
NAS 1.15:77028
NASA-TM-77028
Accession Number
83N21040
Funding Number(s)
CONTRACT_GRANT: NASW-3541
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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