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Eddy current X-Y scanner systemThe Nondestructive Evaluation Branch of the Materials and Processes Laboratory became aware of a need for a miniature, portable X-Y scanner capable of performing eddy current or other nondestructive testing scanning operations such as ultrasonic, or small areas of flat plate. The technical description and operational theory of the X-Y scanner system designed and built to fulfill this need are covered. The scanner was given limited testing and performs according to its design intent, which is to scan flat plate areas of approximately 412 sq cm (64 sq in) during each complete cycle of scanning.
Document ID
19830014300
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Kurtz, G. W. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 4, 2013
Publication Date
February 1, 1983
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.15:82513
NASA-TM-82513
Accession Number
83N22571
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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